Divide and Conquer the Embedding Space for Metric Learning

TitleDivide and Conquer the Embedding Space for Metric Learning
Publication TypeConference Proceedings
Year of Publication2019
AuthorsSanakoyeu, A, Tschernezki, V, B├╝chler, U, Ommer, B
Conference Name Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition (CVPR)
Keywordsdeep learning, metric learning
URLhttps://github.com/CompVis/metric-learning-divide-and-conquer
Citation Key6299